Fluctuations and Thin Film Growth
نویسندگان
چکیده
Two-dimensional mound coarsening is studied using a continuum model in which the effects of deposition noise have been included but in which coalescence due to mass transfer is assumed to be negligible as expected at low temperature. In agreement with scaling arguments for the case of fluctuation-dominated mound coarsening, we find n = β = 1/3, where n is the mound coarsening exponent and β is the surface roughening exponent. Our technique for including the effects of deposition noise in a continuum model may have applications in future three-dimensional simulations of polycrystalline growth.
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